Frequency Function in Atomic Force Microscopy Applied to a Liquid Environment
نویسندگان
چکیده
منابع مشابه
Frequency Function in Atomic Force Microscopy Applied to a Liquid Environment
Scanning specimens in liquids using commercial atomic force microscopy (AFM) is very time-consuming due to the necessary try-and-error iteration for determining appropriate triggering frequencies and probes. In addition, the iteration easily contaminates the AFM tip and damages the samples, which consumes probes. One reason for this could be inaccuracy in the resonant frequency in the feedback ...
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ژورنال
عنوان ژورنال: Sensors
سال: 2014
ISSN: 1424-8220
DOI: 10.3390/s140609369